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FPGA可编程逻辑器件芯片EP4SGX180FF35C3N中文规格书 - 图文 

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OCT calibration is automatically performed at power-up for OCT-enabled I/Os. Table1–13 lists OCT variation with temperature and voltage after power-up

calibration. Use Table1–13 to determine the OCT variation after power-up calibration and Equation1–1 to determine the OCT variation without re-calibration.Equation1–1.OCT Variation Without Re-Calibration(1), (2), (3), (4), (5), (6)

dRdR

-??V??ROCT=RSCAL?1+?------??T???------??dTdV

Notes to Equation1–1:

(1)The ROCT value calculated from Equation1–1 shows the range of OCT resistance with the variation of temperature

and VCCIO.(2)RSCAL is the OCT resistance value at power-up.

(3)?T is the variation of temperature with respect to the temperature at power-up.(4)?V is the variation of voltage with respect to the VCCIO at power-up.(5)dR/dT is the percentage change of RSCAL with temperature.(6)dR/dV is the percentage change of RSCAL with voltage.

Table1–13 lists the OCT variation after the power-up calibration.Table1–13.OCT Variation after Power-Up Calibration (1)

Symbol

Description

VCCIO (V)3.0

dR/dV

OCT variation with voltage without re-calibration

2.51.81.51.23.0

dR/dT

OCT variation with temperature without re-calibration

2.51.81.51.2

Note to Table1–13:

(1)Valid for VCCIO range of ±5% and temperature range of 0° to 85°C.

Typical0.02970.03440.04990.07440.12410.1890.2080.2660.2730.317

Unit

%/mV

%/°C

Pin Capacitance

Table1–14 lists the Stratix IV device family pin capacitance.

Table1–14.Pin Capacitance for Stratix IV Devices (Part 1 of 2)

SymbolCIOTBCIOLRCCLKTBCCLKLR

Description

Input capacitance on the top and bottom I/O pinsInput capacitance on the left and right I/O pins

Input capacitance on the top and bottom non-dedicated clock input pinsInput capacitance on the left and right non-dedicated clock input pins

Value4444

UnitpFpFpFpF

Stratix IV Device Handbook

Volume 4: Device Datasheet and Addendum

Chapter 1:DC and Switching Characteristics for Stratix IV Devices

Switching Characteristics

Table1–30.Transceiver Block Jitter Specifications for Stratix IV GX Devices(1), (2) (Part 9 of 9)

–2 CommercialSpeed GradeMinTyp

Jitter Frequency = 21.8 KHz

Sinusoidal Jitter

tolerance at 3072Mbps

Pattern = CJPATJitter Frequency = 1843.2MHz to 20MHzPattern = CJPAT

Notes to Table1–30:

Symbol/Description

Conditions

–3 Commercial/Industrial

and –2× Commercial

Speed GradeMin

Typ>8.5

Max

–3 Military(3) and–4 Commercial/Industrial Speed

GradeMinTyp

>8.5

Max

Unit

Max

>8.5UI

>0.1>0.1>0.1UI

Stratix IV Device Handbook

Volume 4: Device Datasheet and Addendum

Chapter 1:DC and Switching Characteristics for Stratix IV DevicesSwitching Characteristics

Stratix IV Device Handbook

Volume 4: Device Datasheet and Addendum

Chapter 1:DC and Switching Characteristics for Stratix IV Devices

Switching Characteristics

Table1–31.Transceiver Jitter Specifications for Protocols by Stratix IV GT Devices (Part 2 of 2)Symbol/Description

Conditions

Jitter Frequency = 40KHzPattern = PRBS-31 Equalization = Disabled

Sinusoidal Jitter tolerance

BER = 1E-12

Jitter Frequency ?4MHzPattern = PRBS-31Equalization = DisabledBER = 1E-12

>0.05

>0.05

UI

>5

>5

UI

–1 Industrial Speed –2 Industrial Speed –3 Industrial Speed

GradeGradeGradeMin

Typ

Max

Min

Typ

Max

Min

Typ

Max

Unit

Stratix IV Device Handbook

Volume 4: Device Datasheet and Addendum

Chapter 1:DC and Switching Characteristics for Stratix IV DevicesSwitching Characteristics

Table1–37.Configuration Mode Specifications for Stratix IV Devices

Programming Mode

Remote update only in fast AS mode

Note to Table1–37:

(1)This denotes the maximum frequency supported in the FPP configuration scheme. The frequency supported for

each device may vary depending on device density. For more information, refer to the Configuration, DesignSecurity, and Remote System Upgrades in Stratix IV Devices chapter.

DCLK FMAX

Min4.3

Typ5.3

Max10

UnitMHz

Table1–38 lists the JTAG timing parameters and values for Stratix IV devices. Table1–38.JTAG Timing Parameters and Values for Stratix IV Devices

SymboltJCPtJCHtJCLtJPSU (TDI)tJPSU (TMS)tJPHtJPCOtJPZXtJPXZ

Description

TCK clock periodTCK clock high timeTCK clock low timeTDI JTAG port setup timeTMS JTAG port setup timeJTAG port hold timeJTAG port clock to output

JTAG port high impedance to valid outputJTAG port valid output to high impedance

Min301414135———

Max——————11 (1)14 (1)14 (1)

Unitnsnsnsnsnsnsnsnsns

Note to Table1–38:

(1)A 1 ns adder is required for each VCCIO voltage step down from 3.0 V. For example, tJPCO = 12 ns if VCCIO of the TDO

I/O bank = 2.5 V, or 13 ns if it equals 1.8 V.

Temperature Sensing Diode Specifications

Table1–39 lists the specifications for the Stratix IV temperature sensing diode.Table1–39.External Temperature Sensing Diode Specifications for StratixIV Devices

Description

Ibias, diode source currentVbias, voltage across diodeSeries resistanceDiode ideality factor

Min80.3—1.026

Typ———1.028

Max5000.9< 51.030

Unit?AV?—

Table1–40 lists the specifications for the Stratix IV internal temperature sensing diode.

Table1–40.Internal Temperature Sensing Diode Specifications for StratixIV DevicesTemperature

Accuracy

Range–40 to 100°C

±8°C

Offset Calibrated

Option

No

Sampling RateFrequency: 500kHz, 1MHz

Conversion Time<100ms

Resolution8bits

Minimum Resolution with No Missing Codes

8bits

Stratix IV Device Handbook

Volume 4: Device Datasheet and Addendum

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