软件测试参考文献

软件测试

Generating Functional DesignVeri cation Tests

WITH

THEGROWINGCOMPLEXITY

and interaction of vehicle functions, a reliableSUSANA STOICAfunctional test methodology has become aFord Motor Company

major concern of the automobile industry. In1995, Ford Motor Company started a concen-trated effort to de ne for itself and its suppliersan effective test strategy for functionality veri- cation. Ford successfully applied the strate-gy in a highly cost-conscious environment thatdemands high quality and fast test turnaround.The robust test method (RTM) presented hereis an important component of this strategy.RTM was born out of Japanese industry’sneed to establish its competitive capabilityafter World War II by providing high-qualityproducts. Genichi Taguchi, through his re-search in the 1950s and early 1960s, devel-oped and validated a Design of Experimentstechnique that uses orthogonal arrays.1Madhav Phadke,2,3while working at AT&Tin the 1980s, further developed the tech-nique by de ning a methodology for apply-ing orthogonal arrays to software testing. InThe Robust Test Method,

1994, he introduced the methodology toa functional test

Ford Motor Company. RTM’s introductiongeneration methodology,

into the test process translated into a quan-translated into atum jump in test quality, allowing the de-quantum jump in testtection of previously undetected faults.quality at Ford. AppliedRobust testing was rst applied to subsystem-to subsystem-levellevel functional design veri cation. It led todesign veri cation, itthe detection of more errors than moduledetected more errorsand system functional tests combined, whilethan module and systemreducing test turnaround time by 30%.

tests combined, whilereducing test turnaround

RTM advantages

time by 30%.

RTM is a functional test generationmethodology based on orthogonal arrays.4

JULY–SEPTEMBER 19990740-7475/99/$10.00 ©1999 IEEEBy functional Design Verification we under-stand the totality of tests used to verify that agiven device under test (DUT) delivers thefunctionality de ned in the correspondingengineering speci cation.5,6

RTM uses the same set of orthogonal ar-rays7used originally by Taguchi, butTaguchi’s design-of-experiments methoddeals with process parameter variations,while RTM focuses on functional input val-ues to the device under test.

RTM’s major advantages are that

sit is applicable at all integration stages(including software)5

sit enables easy correlation of test resultsfrom different stages

sit offers a structured approach to tests

it is applicable to both input-dependentand state-dependent output values, aslong as the relationships are wellde ned

s

its black-box approach allows test setde nition in parallel with design, thusenabling a shorter project turnaroundsit is independent of a speci c productimplementation

s

when speci cations change during de-velopment, it enables very fast changesof the test set

sit saves development time

s

being independent of the test engineer’sprior experience, RTM typically expandsthe palette of tested combinations

s

it enables considerable product im-provement in the product definitionphase

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