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Nanolithography and manipulation of graphene using an atomic force microscope(3)

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We use an atomic force microscope (AFM) to manipulate graphene films on a nanoscopic length scale. By means of local anodic oxidation with an AFM we are able to structure isolating trenches into single-layer and few-layer graphene flakes, opening the possi

In this work we will demonstrate how an AFM can be used to locate and nano-manipulate single and few-layer graphene sheets. We will show that the way in which a graphene sheet can be manipulated depends strongly on the substrate it is placed on. Second, we will demonstrate how graphene sheets can be shaped by means of electrochemical oxidation, an extremely promising technique for desktop proof-of-principle device fabrication.

2. Experimental techniques, results and discussion

In the past SPM manipulation techniques have already been shown effective to tear, to fold and unfold, and to oxidize graphitic sheets on highly oriented pyrolytic graphite (HOPG) surfaces

[23–28]. These experiments already led to speculations towards its use as a tool for nanofabrication of graphitic devices in general and carbon nanotubes, in particular [29]. An interesting question to address is whether such an approach can also be applied on few-layer graphene placed on a SiO2 substrate. For this means we have deposited graphene flakes on a SIMOX wafer using micromechanical exfoliated natural graphite [4, 5]. Their position and thickness was subsequently determined under an optical microscope and confirmed by AFM imaging. Trying to scratch through or to peel-off single graphene layers from these few-layer flakes was unsuccessful; due to the relatively low sticking force of the graphene to the rather rough surface of SiO2 it was only possible to move or crumble entire flakes in a rather uncontrolled fashion.

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