5962R9689104VYC中文资料(2)

DEVICE OPERATION

The UT28F256 has three control inputs: Chip Enable (CE), Program Enable (PE), and Output Enable (OE); fifteen address inputs, A(14:0); and eight bidirectional data lines, DQ(7:0). CE is the device enable input that controls chip selection, active, and standby modes. Asserting CE causes IDD to rise to its active value and decodes the fifteen address inputs to select one of 32,768 words in the memory. PE controls program and read operations. During a read cycle, OE must be asserted to enable the outputs.PIN CONFIGURATION

PIN NAMES

A(14:0)CEOEPEDQ(7:0)

AddressChip EnableOutput EnableProgram EnableData Input/Data Output

Table 1. Device Operation Truth Table 1

A14A12A7A6A5A4A3A2A1A0DQ0DQ1DQ2VSS

1234567891011121314

2827262524232221201918171615

VDDPEA13A8A9A11OEA10CEDQ7DQ6DQ5DQ4DQ3

Notes:

1. “X” is defined as a “don’t care” condition. 2. Device active; outputs disabled.

OEX011

PE1101

CE1000

I/O MODEThree-stateData OutData InThree-state

MODEStandbyReadProgramRead 2

ABSOLUTE MAXIMUM RATINGS 1(Referenced to VSS)

SYMBOLVDDVI/OTSTGPDTJΘJCII

PARAMETER

DC supply voltageVoltage on any pinStorage temperatureMaximum power dissipationMaximum junction temperatureThermal resistance, junction-to-case 2DC input current

LIMITS-0.3 to 7.0-0.5 to (VDD + 0.5)-65 to +150

1.5+1753.3

UNITSVV°CW°C°C/WmA

±10

Notes:

1.Stresses outside the listed absolute maximum ratings may cause permanent damage to the device. This is a stress rating only, and functional operation of the device at these or any other conditions beyond limits indicated in the operational sections of this specification is not recommended. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.2.Test per MIL-STD-883, Method 1012, infinite heat sink.

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