GS88136BT-300中文资料(18)

GS88118B(T/D)/GS88132B(T/D)/GS88136B(T/D)

Rev: 1.05 11/200518/39© 2002, GSI Technology

Specifications cited are subject to change without notice. For latest documentation see .

50% tKC

V SS – 2.0 V

50%V SS V IH

Undershoot Measurement and Timing

Overshoot Measurement and Timing

50% tKC

V DD + 2.0 V

50%V DD

V IL

Capacitance

o C, f = 1 MH Z , V DD Parameter

Symbol

Test conditions

Typ.

Max.

Unit

Input Capacitance C IN V IN = 0 V 45pF Input/Output Capacitance C I/O

V OUT = 0 V

6

7

pF

Note:

These parameters are sample tested.AC Test Conditions

Parameter

Conditions

Input high level V DD – 0.2 V Input low level 0.2 V Input slew rate 1 V/ns Input reference level V DD /2Output reference level

V DDQ /2Output load

Fig. 1

Notes:

1.Include scope and jig capacitance.

2.Test conditions as specified with output loading as shown in Fig. 1

unless otherwise noted.

3.Device is deselected as defined by the Truth Table.

DQ

V DDQ/2

50?30pF *

Output Load 1

* Distributed Test Jig Capacitance

(T A = 25= 2.5 V)

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