Fault Sensitivity Analysis and Reliability Enhancement of Analog-to-Digital Converters(14)

Abstract — Reliability of systems used in space, avionic and biomedical applications is highly critical. Such systems consist of an analog front-end to collect data, an Analog-to-Digital Converter (ADC) to convert the collected data to digital form and a

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CMOSCircuits,”inProceedingsofIEEEInternationalConferenceonComputerDesign,Oct1993,pp.538–542.MandeepSingh(M’01)receivedtheB.E(Hons.)de-greeinelectricalengineeringfromtheBirlaInsti-tuteofTechnologyandSciences,Rajasthan,Indiain1997andtheM.S.degreeinelectricalandcomputerengineeringfromtheUniversityofMassachusetts,PLACE

Amherst,in2001.WhileattheUniversityofMas-PHOTO

sachusetts,hecompletedhisthesisontheReliabilityHERE

EnhancementofAnalog-to-DigitalConverters.HeworkedforWiproGlobalResearchandDevelop-ment,Bangalore,Indiafrom1997to1999,wherehewasinvolvedinthedesignanddevelopmentofhigh

speedcommunicationASICs.HeiscurrentlyworkingforAdvancedMicroDe-vicesintheComputationProductsGroup,Austin,TX,whereheisinvolvedinhighperformancemicroprocessordesign.

IsraelKoren(S’72-M’76-SM’87-F’91)receivedtheB.Sc.,M.Sc.andD.Sc.degreesfromtheTech-nion-IsraelInstituteofTechnology,Haifa,in1967,1970,and1975,respectively,allinElectricalEn-gineering.HeiscurrentlyaProfessorofElectri-PLACE

calandComputerEngineeringattheUniversityofPHOTO

Massachusetts,Amherst.PreviouslyhewaswiththeHERE

Technion-IsraelInstituteofTechnology.HealsoheldvisitingpositionswiththeUniversityofCali-forniaatBerkeley,UniversityofSouthernCalifornia,LosAngelesandUniversityofCalifornia,SantaBar-bara.HehasbeenaconsultanttoseveralcompaniesincludingIBM,Intel,AnalogDevices,AMD,DigitalEquipmentCorp.,NationalSemiconductorandTolerantSystems.

Dr.Koren’scurrentresearchinterestsincludeTechniquesforYieldandReliabilityEnhancement,Fault-TolerantArchitectures,Real-timesystemsandComputerArithmetic.HepublishedextensivelyinseveralIEEETransactionsandhasover150publicationsinrefereedjournalsandconferences.Hecur-rentlyservesontheEditorialBoardoftheIEEETransactionsonVLSISystems.HewasaCo-GuestEditorfortheIEEETransactionsonComputers,specialis-sueonHighYieldVLSISystems,April1989andthespecialissueonComputerArithmetic,July2000,andservedontheEditorialBoardoftheseTransactionsbetween1992and1997.HealsoservedasGeneralChair,ProgramChairandProgramCommitteememberfornumerousconferences.Hehaseditedandco-authoredthebook,DefectandFault-ToleranceinVLSISystems,Vol.1,Plenum,1989.HeistheauthorofthetextbookComputerArithmeticAlgo-rithms,2ndEdition,A.K.Peters,Ltd.,2002.

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